Math. Model. Nat. Phenom.
Volume 7, Number 4, 2012Modelling phenomena on micro- and nanoscale
|Page(s)||6 - 19|
|Published online||09 July 2012|
Effects of In-plane Elastic Stress and Normal External Stress on Viscoelastic Thin Film Stability
Laboratoire de Physico–Chimie Théorique – UMR CNRS Gulliver
7083, ESPCI 10 rue
2 Physikalisches Institut, Albert–Ludwigs–Universität, 79104 Freiburg, Germany
3 Institut Charles Sadron, 23 rue du Loess, 67034 Strasbourg, France
∗ Corresponding author. E-mail: firstname.lastname@example.org
Motivated by recent experiments on the electro-hydrodynamic instability of spin-cast polymer films, we study the undulation instability of a thin viscoelastic polymer film under in-plane stress and in the presence of either a close by contactor or an electric field, both inducing a normal stress on the film surface. We find that the in-plane stress affects both the typical timescale of the instability and the unstable wavelengths. The film stability is also sensitive to the boundary conditions used at the film-substrate interface. We have considered two conditions, either rigidly attaching the film to the substrate or allowing for slip.
Mathematics Subject Classification: 74B20 / 74D10 / 74F15 / 74H55 / 74K35 / 76E17
Key words: thin films / polymers / instability / mechanics / (visco)elasticity / internal / residual stress
© EDP Sciences, 2012
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